1 - 2 |
2nd-Harmonic Generation from the Monolayers of Amphiphilic Ferrocene Derivatives Wang KZ, Huang CH, Xu GX, Zhao XS, Xie XM, Xu LG, Li TK |
3 - 7 |
Improved CdS Buffer Window Layers for Thin-Film Solar-Cells Chemseddine A, Fearheiley ML |
8 - 14 |
Variation of Trap State Density and Barrier Height with Cu/in Ratio in CuInSe2 Films Pal R, Chattopadhyay KK, Chaudhuri S, Pal AK |
15 - 23 |
Influence of Discharge Parameters on the Layer Properties of Reactive Magnetron-Sputtered ZnO-Al Films Ellmer K, Kudella F, Mientus R, Schieck R, Fiechter S |
24 - 33 |
Characterization of Long-Periodic Layered Structures by X-Ray-Diffraction .5. Small-Angle X-Ray-Scattering of Distorted Multilayers Sasanuma Y, Nakayama K |
34 - 38 |
TaC Coatings Prepared by Hot-Filament Chemical-Vapor-Deposition - Characterization and Properties Dua AK, George VC |
39 - 43 |
Direct Observation of Silicide Growth at Fe-Si Interface During Pulsed-Laser Deposition Chubunova EV, Khabelashvili ID, Lebedinskii YY, Nevolin VN, Zenkevich A |
44 - 50 |
Titanium Disilicide on Silicon by Interdiffusion of Titanium and Amorphous-Silicon Multilayers - Transmission Electron-Microscopy, Spectroscopic Ellipsometry and Resistivity Measurements Nassiopoulos AG, Tambouris D, Frangis N, Logothetidis S, Georga S, Krontiras C, Xanthopoulos N |
51 - 55 |
In-Situ Detection of Electrical-Conductivity Variation of an A-WO3 Thin-Film During Electrochemical Reduction and Oxidation in Liclo4(M)-PC Electrolyte Bohnke O, Gire A, Theobald JG |
56 - 63 |
Role of Oxide-Ion Concentration on the Oxidation Behavior of Zirconium in Molten NaNO3-KNO3 Eutectic Elrahman HA, Baraka AM, Morsi MS, Elgwad SA |
64 - 78 |
Complex XRD Microstructural Studies of Hard Coatings Applied to PVD-Deposited Tin Films .1. Problems and Methods Kuzel R, Cerny R, Valvoda V, Blomberg M, Merisalo M |
79 - 84 |
Surface Modification of Ferritic Stainless-Steel by Laser Alloying Tsai WT, Shieh CH, Lee JT |
85 - 93 |
Low-Temperature Metal-Organic Chemical-Vapor-Deposition of Advanced Barrier Layers for the Microelectronics Industry Raaijmakers IJ |
94 - 97 |
The Composition Dependence of the Optical-Constants in Amorphous Sbxse1-X Thin-Films Zayed HA, Aboelsoud AM, Ibrahim AM, Kenawy MA |
98 - 103 |
Scanning Tunneling Topography and Spectroscopy of Gold Particles Sputtered on BaTiO3 David T, Dufour JP, Goudonnet JP |
104 - 111 |
Recent Advances in the Application of Collimated Sputtering Vollmer B, Licata T, Restaino D, Ryan J |
112 - 119 |
Transport-Properties and Band-Structure of Nonstoichiometric Cu2-Xte Mansour BA, Farag BS, Khodier SA |
120 - 128 |
Order-Disorder Transitions of Yttrium Arachidate Langmuir-Blodgett-Films via Ellipsometric Anisotropies Johnson DJ, Amm DT |
129 - 133 |
A New Electrochemical Method for Selenization of Stacked Cuin Layers and Preparation of CuInSe2 by Thermal Annealing Fritz HP, Chatziagorastou P |
134 - 139 |
Growth of GaSe Layered Compound on a GaAs (001) Surface Fujita K, Izumi T, Ohsaki K, Tambo T, Ueba H, Tatsuyama C |
140 - 143 |
Optical and Electrical-Properties of V2O5 Thin-Films Elsoud AM, Mansour B, Soliman LI |