화학공학소재연구정보센터

Thin Solid Films

Thin Solid Films, Vol.617 Entire volume, number list
ISSN: 0040-6090 (Print) 

In this Issue (29 articles)

1 - 2 European Materials Research Society Spring Meeting 2015, Symposium DD [E'MRS 2015 Symp. DD] Preface
Modreanu M, Durand O, Jellison GE, Salviati G, Letoublon A
3 - 8 On the growth of transparent conductive oxide ternary alloys Zn-Ir-O (ZIRO) by the means of rf magnetron co-sputtering
Michail G, Kambylafka V, Kortidis I, Tsagaraki K, Androulidaki M, Kiriakidis G, Binas V, Modreanu M, Aperathitis E
9 - 13 X-ray nanodiffraction in forward scattering and Bragg geometry of a single isolated Ag-Au nanowire
Fernandez S, Richard MI, Floettoto D, Richter G, Mandula O, Aizarna ME, Favre-Nicolin V, Burghammer M, Schtilli T, Thomas O
14 - 19 Natural optical activity vs circular Bragg reflection studied by Mueller matrix ellipsometry
Arteaga O
20 - 24 Effective medium approximation of ellipsometric response from random surface roughness simulated by finite-element method
Fodor B, Kozma P, Burger S, Fried M, Petrik P
25 - 32 Scanning optical cavity for internal roughness measurement of embedded micro-structures
Di Donato A, Lo Turco S, Criante L
33 - 37 Optimization and quantification of surface enhanced infrared absorption using gradient gold island films
Kratz C, Oates TWH, Hinrichs K
38 - 43 Optical properties of a nanostructured glass-based film using spectroscopic ellipsometry
Jellison GE, Aytug T, Lupini AR, Paranthaman MP, Joshi PC
44 - 47 Stress buildup during crystallization of thin chalcogenide films for memory applications: In situ combination of synchrotron X-Ray diffraction and wafer curvature measurements
Ouled-Khachroum T, Richard MI, Noe P, Guichet C, Mocuta C, Sabbione C, Hippert F, Thomas O
48 - 54 SIRIUS: A new beamline for in situ X-ray diffraction and spectroscopy studies of advanced materials and nanostructures at the SOLEIL Synchrotron
Ciatto G, Chu MH, Fontaine P, Aubert N, Renevier H, Deschanvres JL
55 - 55 Preface
Marchiori C, Dubourdieu C, Waser R, Prellier W
56 - 62 Metal-insulator transitions in (V1-xCrx)(2)O-3 thin films deposited by reactive direct current magnetron co-sputtering
Querre M, Janod E, Cario L, Tranchant J, Corraze B, Bouquet V, Deputier S, Cordier S, Guilloux-Viry M, Besland MP
63 - 66 Forming free resistive switching in Au/TiO2/Pt stack structure
Luo WB, Zhang P, Shuai Y, Pan XQ, Wu QQ, Wu CG, Yang C, Zhang WL
67 - 70 Sol-gel deposition of Pb(Zr,Ti)O-3 on GaAs/InGaAs quantum well heterostructure via SrTiO3 templates: Stability of the semiconductor during oxide growth
Meunier B, Largeau L, Regreny P, Bachelet R, Vilquin B, Penuelas J, Saint-Girons G
71 - 75 Low noise and fast response of infrared sensing structures based on amorphous Y-Ba-Cu-O semiconducting thin films sputtered on silicon
Kreisler AJ, Degardin AF, Galiano X, Alamarguy D
76 - 81 Microstructure and local electrical investigation of lead-free alpha-La2WO6 ferroelectric thin films by piezoresponse force microscopy
Carlier T, Chambrier MH, Ferri A, Bayart A, Roussel P, Saitzek S, Desfeux R
82 - 85 Ultrathin junctions based on the LaSrMnO3/Nb:SrTiO3 functional oxide interface
Kurij G, Calvet LE, Guerrero R, Maroutian T, Agnus G, Solignac A, Lecoeur P
86 - 94 Numerical and experimental investigation of transparent and conductive TiOx/Ag/TiOx electrode
Bou A, Torchio P, Barakel D, Thoulon PY, Ricci M
95 - 102 Doping Ga effect on ZnO radio frequency sputtered films from a powder target
Chaabouni F, Khalfallah B, Abaab M
103 - 107 Optical properties of ZnO thin films obtained by heat treatment of Zn thin films on amorphous SiO2 substrates and single crystalline GaSe lamellas
Caraman I, Dmitroglo L, Evtodiev I, Leontie L, Untila D, Hamzaoui S, Zerdali M, Susu O, Bulai G, Gurlui S
108 - 113 Al2O3 thin films deposited by thermal atomic layer deposition: Characterization for photovoltaic applications
Barbos C, Blanc-Pelissier D, Fave A, Botella C, Regreny P, Grenet G, Blanquet E, Crisci A, Lemiti M
114 - 119 Temperature dependence of charge transport in zinc oxide nanosheet source-gated transistors
Dahiya AS, Opoku C, Cayrel F, Valente D, Poulin-Vittrant G, Camara N, Alquier D
120 - 125 Effect of doping concentration and temperature on the morphology, crystallinity and electrical conductivity of Al:ZnO nanostructured films grown from aqueous solution
Musat V, Mazilu M, Tigau N, Alexandru P, Dinescu A, Purica M
126 - 132 High performance inverted polymer solar cells with solution processed metal oxides as electron transport layers: A comparative study
Morvillo P, Diana R, Nenna G, Bobeico E, Ricciardi R, Minarini C
133 - 137 Annealing effects on SiOxNy thin films: Optical and morphological properties
Perani M, Brinkmann N, Fazio MA, Hammud A, Terheiden B, Cavalcoli D
138 - 142 Surface treatments on AlGaN/GaN heterostructures for gate dielectric Al2O3 thin films grown by Atomic Layer Deposition
Lo Nigro R, Schiliro E, Greco G, Fiorenza P, Roccaforte F
143 - 149 Optical, structural and electrical characterizations of stacked Hf-based and silicon nitride dielectrics
Khomenkova L, Normand P, Gourbilleau F, Slaoui A, Bonafos C
150 - 155 Realization of a graphene gate field effect transistor for electrochemical detection and biosensors
Pezard J, Lazar M, Haddour N, Botella C, Roy P, Brubach JB, Wysocka D, Vilquin B, Romeo PR, Buret F
156 - 160 Textured ZnO thin films by sol-gel process: Synthesis and characterizations
Znaidi L, Chauveau T, Tallaire A, Liu F, Rahmani M, Bockelee V, Vrel D, Doppelt P