1 - 2 |
European Materials Research Society Spring Meeting 2015, Symposium DD [E'MRS 2015 Symp. DD] Preface Modreanu M, Durand O, Jellison GE, Salviati G, Letoublon A |
3 - 8 |
On the growth of transparent conductive oxide ternary alloys Zn-Ir-O (ZIRO) by the means of rf magnetron co-sputtering Michail G, Kambylafka V, Kortidis I, Tsagaraki K, Androulidaki M, Kiriakidis G, Binas V, Modreanu M, Aperathitis E |
9 - 13 |
X-ray nanodiffraction in forward scattering and Bragg geometry of a single isolated Ag-Au nanowire Fernandez S, Richard MI, Floettoto D, Richter G, Mandula O, Aizarna ME, Favre-Nicolin V, Burghammer M, Schtilli T, Thomas O |
14 - 19 |
Natural optical activity vs circular Bragg reflection studied by Mueller matrix ellipsometry Arteaga O |
20 - 24 |
Effective medium approximation of ellipsometric response from random surface roughness simulated by finite-element method Fodor B, Kozma P, Burger S, Fried M, Petrik P |
25 - 32 |
Scanning optical cavity for internal roughness measurement of embedded micro-structures Di Donato A, Lo Turco S, Criante L |
33 - 37 |
Optimization and quantification of surface enhanced infrared absorption using gradient gold island films Kratz C, Oates TWH, Hinrichs K |
38 - 43 |
Optical properties of a nanostructured glass-based film using spectroscopic ellipsometry Jellison GE, Aytug T, Lupini AR, Paranthaman MP, Joshi PC |
44 - 47 |
Stress buildup during crystallization of thin chalcogenide films for memory applications: In situ combination of synchrotron X-Ray diffraction and wafer curvature measurements Ouled-Khachroum T, Richard MI, Noe P, Guichet C, Mocuta C, Sabbione C, Hippert F, Thomas O |
48 - 54 |
SIRIUS: A new beamline for in situ X-ray diffraction and spectroscopy studies of advanced materials and nanostructures at the SOLEIL Synchrotron Ciatto G, Chu MH, Fontaine P, Aubert N, Renevier H, Deschanvres JL |
55 - 55 |
Preface Marchiori C, Dubourdieu C, Waser R, Prellier W |
56 - 62 |
Metal-insulator transitions in (V1-xCrx)(2)O-3 thin films deposited by reactive direct current magnetron co-sputtering Querre M, Janod E, Cario L, Tranchant J, Corraze B, Bouquet V, Deputier S, Cordier S, Guilloux-Viry M, Besland MP |
63 - 66 |
Forming free resistive switching in Au/TiO2/Pt stack structure Luo WB, Zhang P, Shuai Y, Pan XQ, Wu QQ, Wu CG, Yang C, Zhang WL |
67 - 70 |
Sol-gel deposition of Pb(Zr,Ti)O-3 on GaAs/InGaAs quantum well heterostructure via SrTiO3 templates: Stability of the semiconductor during oxide growth Meunier B, Largeau L, Regreny P, Bachelet R, Vilquin B, Penuelas J, Saint-Girons G |
71 - 75 |
Low noise and fast response of infrared sensing structures based on amorphous Y-Ba-Cu-O semiconducting thin films sputtered on silicon Kreisler AJ, Degardin AF, Galiano X, Alamarguy D |
76 - 81 |
Microstructure and local electrical investigation of lead-free alpha-La2WO6 ferroelectric thin films by piezoresponse force microscopy Carlier T, Chambrier MH, Ferri A, Bayart A, Roussel P, Saitzek S, Desfeux R |
82 - 85 |
Ultrathin junctions based on the LaSrMnO3/Nb:SrTiO3 functional oxide interface Kurij G, Calvet LE, Guerrero R, Maroutian T, Agnus G, Solignac A, Lecoeur P |
86 - 94 |
Numerical and experimental investigation of transparent and conductive TiOx/Ag/TiOx electrode Bou A, Torchio P, Barakel D, Thoulon PY, Ricci M |
95 - 102 |
Doping Ga effect on ZnO radio frequency sputtered films from a powder target Chaabouni F, Khalfallah B, Abaab M |
103 - 107 |
Optical properties of ZnO thin films obtained by heat treatment of Zn thin films on amorphous SiO2 substrates and single crystalline GaSe lamellas Caraman I, Dmitroglo L, Evtodiev I, Leontie L, Untila D, Hamzaoui S, Zerdali M, Susu O, Bulai G, Gurlui S |
108 - 113 |
Al2O3 thin films deposited by thermal atomic layer deposition: Characterization for photovoltaic applications Barbos C, Blanc-Pelissier D, Fave A, Botella C, Regreny P, Grenet G, Blanquet E, Crisci A, Lemiti M |
114 - 119 |
Temperature dependence of charge transport in zinc oxide nanosheet source-gated transistors Dahiya AS, Opoku C, Cayrel F, Valente D, Poulin-Vittrant G, Camara N, Alquier D |
120 - 125 |
Effect of doping concentration and temperature on the morphology, crystallinity and electrical conductivity of Al:ZnO nanostructured films grown from aqueous solution Musat V, Mazilu M, Tigau N, Alexandru P, Dinescu A, Purica M |
126 - 132 |
High performance inverted polymer solar cells with solution processed metal oxides as electron transport layers: A comparative study Morvillo P, Diana R, Nenna G, Bobeico E, Ricciardi R, Minarini C |
133 - 137 |
Annealing effects on SiOxNy thin films: Optical and morphological properties Perani M, Brinkmann N, Fazio MA, Hammud A, Terheiden B, Cavalcoli D |
138 - 142 |
Surface treatments on AlGaN/GaN heterostructures for gate dielectric Al2O3 thin films grown by Atomic Layer Deposition Lo Nigro R, Schiliro E, Greco G, Fiorenza P, Roccaforte F |
143 - 149 |
Optical, structural and electrical characterizations of stacked Hf-based and silicon nitride dielectrics Khomenkova L, Normand P, Gourbilleau F, Slaoui A, Bonafos C |
150 - 155 |
Realization of a graphene gate field effect transistor for electrochemical detection and biosensors Pezard J, Lazar M, Haddour N, Botella C, Roy P, Brubach JB, Wysocka D, Vilquin B, Romeo PR, Buret F |
156 - 160 |
Textured ZnO thin films by sol-gel process: Synthesis and characterizations Znaidi L, Chauveau T, Tallaire A, Liu F, Rahmani M, Bockelee V, Vrel D, Doppelt P |