화학공학소재연구정보센터

Thin Solid Films

Thin Solid Films, Vol.569 Entire volume, number list
ISSN: 0040-6090 (Print) 

In this Issue (19 articles)

1 - 5 Anisotropic microstructure of hydrothermally-grown non-polar a-plane ZnO on a-plane GaN film
Baik KH, Kim H, Jang S
6 - 9 Electrical characteristics of GdTiO3 gate dielectric for amorphous InGaZnO thin-film transistors
Her JL, Pan TM, Liu JH, Wang HJ, Chen CH, Koyama K
10 - 16 Structural colors of the SiO2/polyethyleneimine thin films on poly(ethylene terephthalate) substrates
Jia YR, Zhang Y, Zhou QB, Fan QG, Shao JZ
17 - 21 Physico-chemical properties of the thin films of the SbxSe100-x system (x=90, 85, 80)
Hromadko L, Prikryl J, Frumar M, Strizik L, Kost'al P, Benes L, Wagner T
22 - 27 Solution processed white light photodetector based N, N'-di(2-ethylhexyl)-3,4,9,10-perylene diimide thin film phototransistor
Tozlu C, Kus M, Can M, Ersoz M
28 - 34 Heterojunction CdS/Sb2S3 solar cells using antimony sulfide thin films prepared by thermal evaporation
Escorcia-Garcia J, Becerra D, Nair MTS, Nair PK
35 - 43 Relationship between nature of metal-oxide contacts and resistive switching properties of copper oxide thin film based devices
Singh B, Mehta BR
44 - 51 Room temperature deposition of high figure of merit Al-doped zinc oxide by pulsed-direct current magnetron sputtering: Influence of energetic negative ion bombardment on film's optoelectronic properties
Fumagalli F, Marti-Rujas J, Di Fonzo F
52 - 56 Formation of silicon nanocrystal films at low temperature during capacitive radio frequency discharge transition to the high-current mode
Xu YM, Yu W, Jiang ZY, Li Y, Li HM, Feng HN
57 - 63 Characterization of SiCN thin films: Experimental and theoretical investigations
Ivashchenko VI, Kozak AO, Porada OK, Ivashchenko LA, Sinelnichenko OK, Lytvyn OS, Tomila TV, Malakhov VJ
64 - 69 Characterization of a-Si:H thin layers incorporated into textured a-Si:H/c-Si solar cell structures by spectroscopic ellipsometry using a tilt-angle optical configuration
Tanaka Y, Matsuki N, Fujiwara H
70 - 75 Friction and wear behavior of thin-film ceramic coatings under lubricated sliding contact
Lorenzo-Martin C, Ajayi OO, Torrel S, Shareef I, Fenske GR
76 - 80 Characterization of CuInS2 thin films prepared by chemical bath deposition and their implementation in a solar cell
Lugo S, Lopez I, Pena Y, Calixto M, Hernandez T, Messina S, Avellaneda D
81 - 92 Microstructural and elasto-plastic material parameters identification by inverse finite elements method of Ti(1-x)AlxN (0 < x < 1) sputtered thin films from Berkovich nano-indentation experiments
Pac MJ, Giljean S, Rousselot C, Richard F, Delobelle P
93 - 99 Carbon nanotubes/laser ablation gold nanoparticles composites
Lascialfari L, Marsili P, Caporali S, Muniz-Miranda M, Margheri G, Serafini A, Brandi A, Giorgetti E, Cicchi S
100 - 103 Enhanced near infrared reflectance of TiO2/SiO2/TiO2 multilayer structure using a base-catalyzed SiO2 film
Choi J, Han K, Kim JH
104 - 112 Structural and optical properties of post-annealed atomic-layer-deposited HfO2 thin films on GaAs
Bennett NS, Cherkaoui K, Wong CS, O'Connor E, Monaghan S, Hurley P, Chauhan L, McNally PJ
113 - 123 Discrimination and detection limits of secondary phases in Cu2ZnSnS4 using X-ray diffraction and Raman spectroscopy
Berg DM, Arasimowicz M, Djemour R, Gutay L, Siebentritt S, Schorr S, Fontane X, Izquierdo-Roca V, Perez-Rodriguez A, Dale PJ
124 - 130 Spectroscopic ellipsometric modeling of a Bi-Te-Se write layer of an optical data storage device as guided by atomic force microscopy, scanning electron microscopy, and X-ray diffraction
Wang H, Madaan N, Bagley J, Diwan A, Liu YQ, Davis RC, Lunt BM, Smith SJ, Linford MR