1 - 5 |
Anisotropic microstructure of hydrothermally-grown non-polar a-plane ZnO on a-plane GaN film Baik KH, Kim H, Jang S |
6 - 9 |
Electrical characteristics of GdTiO3 gate dielectric for amorphous InGaZnO thin-film transistors Her JL, Pan TM, Liu JH, Wang HJ, Chen CH, Koyama K |
10 - 16 |
Structural colors of the SiO2/polyethyleneimine thin films on poly(ethylene terephthalate) substrates Jia YR, Zhang Y, Zhou QB, Fan QG, Shao JZ |
17 - 21 |
Physico-chemical properties of the thin films of the SbxSe100-x system (x=90, 85, 80) Hromadko L, Prikryl J, Frumar M, Strizik L, Kost'al P, Benes L, Wagner T |
22 - 27 |
Solution processed white light photodetector based N, N'-di(2-ethylhexyl)-3,4,9,10-perylene diimide thin film phototransistor Tozlu C, Kus M, Can M, Ersoz M |
28 - 34 |
Heterojunction CdS/Sb2S3 solar cells using antimony sulfide thin films prepared by thermal evaporation Escorcia-Garcia J, Becerra D, Nair MTS, Nair PK |
35 - 43 |
Relationship between nature of metal-oxide contacts and resistive switching properties of copper oxide thin film based devices Singh B, Mehta BR |
44 - 51 |
Room temperature deposition of high figure of merit Al-doped zinc oxide by pulsed-direct current magnetron sputtering: Influence of energetic negative ion bombardment on film's optoelectronic properties Fumagalli F, Marti-Rujas J, Di Fonzo F |
52 - 56 |
Formation of silicon nanocrystal films at low temperature during capacitive radio frequency discharge transition to the high-current mode Xu YM, Yu W, Jiang ZY, Li Y, Li HM, Feng HN |
57 - 63 |
Characterization of SiCN thin films: Experimental and theoretical investigations Ivashchenko VI, Kozak AO, Porada OK, Ivashchenko LA, Sinelnichenko OK, Lytvyn OS, Tomila TV, Malakhov VJ |
64 - 69 |
Characterization of a-Si:H thin layers incorporated into textured a-Si:H/c-Si solar cell structures by spectroscopic ellipsometry using a tilt-angle optical configuration Tanaka Y, Matsuki N, Fujiwara H |
70 - 75 |
Friction and wear behavior of thin-film ceramic coatings under lubricated sliding contact Lorenzo-Martin C, Ajayi OO, Torrel S, Shareef I, Fenske GR |
76 - 80 |
Characterization of CuInS2 thin films prepared by chemical bath deposition and their implementation in a solar cell Lugo S, Lopez I, Pena Y, Calixto M, Hernandez T, Messina S, Avellaneda D |
81 - 92 |
Microstructural and elasto-plastic material parameters identification by inverse finite elements method of Ti(1-x)AlxN (0 < x < 1) sputtered thin films from Berkovich nano-indentation experiments Pac MJ, Giljean S, Rousselot C, Richard F, Delobelle P |
93 - 99 |
Carbon nanotubes/laser ablation gold nanoparticles composites Lascialfari L, Marsili P, Caporali S, Muniz-Miranda M, Margheri G, Serafini A, Brandi A, Giorgetti E, Cicchi S |
100 - 103 |
Enhanced near infrared reflectance of TiO2/SiO2/TiO2 multilayer structure using a base-catalyzed SiO2 film Choi J, Han K, Kim JH |
104 - 112 |
Structural and optical properties of post-annealed atomic-layer-deposited HfO2 thin films on GaAs Bennett NS, Cherkaoui K, Wong CS, O'Connor E, Monaghan S, Hurley P, Chauhan L, McNally PJ |
113 - 123 |
Discrimination and detection limits of secondary phases in Cu2ZnSnS4 using X-ray diffraction and Raman spectroscopy Berg DM, Arasimowicz M, Djemour R, Gutay L, Siebentritt S, Schorr S, Fontane X, Izquierdo-Roca V, Perez-Rodriguez A, Dale PJ |
124 - 130 |
Spectroscopic ellipsometric modeling of a Bi-Te-Se write layer of an optical data storage device as guided by atomic force microscopy, scanning electron microscopy, and X-ray diffraction Wang H, Madaan N, Bagley J, Diwan A, Liu YQ, Davis RC, Lunt BM, Smith SJ, Linford MR |