Thin Solid Films

Thin Solid Films, Vol.530 Entire volume, number list

ISSN: 0040-6090 (Print)

In this Issue (24 articles)

1 - 1	Size&Strain VI Preface Thomas O, Guinebretiere R
2 - 8	On X-ray diffraction study of preferred grain orientations in polycrystalline thin films - Multicomponent texture in KTaO3 films Kuzel R, Bursik J
9 - 13	Grazing incidence X-ray diffraction for the study of polycrystalline layers Simeone D, Baldinozzi G, Gosset D, Le Caer S, Berar JF
14 - 19	Twin boundary-induced intrinsic strengthening in Ni Barabash RI, Rollett A, Lebensohn RA, Barabash OM, Liu W, Pang JWL
20 - 24	Deformation mechanisms in nanocrystalline metals: Insights from in-situ diffraction and crystal plasticity modelling Van Petegem S, Li L, Anderson PM, Van Swygenhoven H
25 - 29	Sin(2) psi analysis in thin films using 2D detectors: Non-linearity due to set-up, stress state and microstructure Faurie D, Geandier G, Renault PO, Le Bourhis E, Thiaudiere D
30 - 34	Deformation modes of nanostructured thin film under controlled biaxial deformation Djaziri S, Faurie D, Le Bourhis E, Goudeau P, Renault PO, Mocuta C, Thiaudiere D, Hild F
35 - 39	Atomistic modeling of lattice relaxation in metallic nanocrystals Gelisio L, Beyerlein KR, Scardi P
40 - 43	Atomistic interpretation of microstrain in diffraction line profile analysis Leonardi A, Leoni M, Scardi P
44 - 48	Solid State Nuclear Magnetic Resonance and X-ray Diffraction Line Profile Analysis of heavily deformed fluorite Abdellatief M, Abele M, Leoni M, Scardi P
49 - 52	The effect of beta irradiation on morphology and micro hardness of polypropylene thin layers Manas D, Hribova M, Manas M, Ovsik M, Stanek M, Samek D
53 - 61	Diffraction residual stress analysis in technical components - Status and prospects Manns T, Scholtes B
62 - 65	Comparison of strain/stress behaviour of a duplex stainless steel between mesoscopic and macroscopic scales by neutron measurements extended to necking range Francois M, Panicaud B, Le Joncour L, Baczmanski A, Paradowska A, Wronski S, Gadalinska E
66 - 70	Stress gradients and grain interaction determination in electrodeposited coatings by synchrotron radiation Ortolani M, Ricardo CLA, Lausi A, Scardi P
71 - 76	Determination of composition, residual stress and stacking fault depth profiles in expanded austenite with energy-dispersive diffraction Jegou S, Christiansen TL, Klaus M, Genzel C, Somers MAJ
77 - 80	Stress measurement in coarse grained material with high-resolution X-ray beams Ortner B
81 - 84	Multireflection grazing incidence diffraction used for stress measurements in surface layers Marciszko M, Baczmanski A, Wrobel M, Seiler W, Braham C, Donges J, Sniechowski M, Wierzbanowski K
85 - 90	Probing strain at the nanoscale with X-ray diffraction in microelectronic materials induced by stressor elements Murray CE, Polvino SM, Noyan IC, Cai Z, Maser J, Holt M
91 - 95	Stress measurements in tungsten coated through silicon vias for 3D integration Krauss C, Labat S, Escoubas S, Thomas O, Carniello S, Teva J, Schrank F
96 - 99	Mechanisms of copper direct bonding observed by in-situ and quantitative transmission electron microscopy Martinez M, Legros M, Signamarcheix T, Bally L, Verrun S, Di Cioccio L, Deguet C
100 - 104	Exploring Pd-Si(001) and Pd-Si(111) thin-film reactions by simultaneous synchrotron X-ray diffraction and substrate curvature measurements Richard MI, Fouet J, Guichet C, Mocuta C, Thomas O
105 - 112	In situ X-ray diffraction study of stacking fault formation in the near-surface region of transformation induced plasticity steels Rafaja D, Krbetschek C, Borisova D, Schreiber G, Klemm V
113 - 119	In situ coherent X-ray diffraction of isolated core-shell nanowires Haag ST, Richard MI, Favre-Nicolin V, Welzel U, Jeurgens LPH, Ravy S, Richter G, Mittemeijer EJ, Thomas O
120 - 124	Strain inhomogeneity in copper islands probed by coherent X-ray diffraction Beutier G, Verdier M, Parry G, Gilles B, Labat S, Richard MI, Cornelius T, Lory PF, Hoang SV, Livet F, Thomas O, de Boissieu M