화학공학소재연구정보센터

Particle & Particle Systems Characterization

Particle & Particle Systems Characterization, Vol.26, No.3 Entire volume, number list
ISSN: 0934-0866 (Print) 

In this Issue (9 articles)

95 - 95 Special Issue: X-Ray Diffraction - New Developments in Technique and Applications Preface
Herrmann M
97 - 106 New Developments and Applications of X-Ray Capillary Optics
Bjeonmikhov A, Bjeoumikhova S, Wedell R
107 - 111 Fast XRD2 Microdiffraction with Focusing X-Ray Microlenses
Berthold C, Bjeoumikhov A, Brugamann L
112 - 116 X-Ray Diffractometry with Low Power Microfocus Sources - New Possibilities in the Lab
Wiesmann J, Graf J, Hoffmann C, Hembd A, Michaelsen C, Yang N, Cordes H, He B, Preckwinkel U, Erlacher K
117 - 124 Hard X-Rays for In Situ Strain and Texture Measurements
Brokmeier HG
125 - 131 The Application of Energy Dispersive Diffraction for Nondestructive Analysis of Large Material Depths and for Residual Stress Determination
Kampfe B, Luczak F, Urban M
132 - 137 Structure, Chemical and Physical Behavior of Aluminum Hydride
Kempa PB, Thome V, Herrmann M
138 - 150 Some Examples of Temperature and Time Resolved Studies of the Dehydration and Hydration Behavior of Zeolites and Clathrates
Depmeier W
151 - 156 Co-Crystallization and Characterization of Pharmaceutical Ingredients
Herrmann M, Forter-Barth U, Krober H, Kempa PB, Juez-Lorenzo MD, Doyle S