Solid-State Electronics
Solid-State Electronics, Vol.102 Entire volume, number list
ISSN: 0038-1101 (Print)
In this Issue (13 articles)
1 - 1 |
SELECTED PAPERS FROM ESSDERC 2013 Foreword Dascalu D |
2 - 11 |
Emerging memories Baldi L, Bez R, Sandhu G |
12 - 24 |
Reconfigurable nanowire electronics - A review Weber WM, Heinzig A, Trommer J, Martin D, Grube M, Mikolajick T |
25 - 41 |
Characterization and modeling of electrical stress degradation in STI-based integrated power devices Reggiani S, Barone G, Gnani E, Gnudi A, Baccarani G, Poli S, Wise R, Chuang MY, Tian WD, Pendharkar S, Denison M |
42 - 45 |
Stepwise set operation for reliable switching uniformity and low operating current of ReRAMs Lee S, Woo J, Lee D, Cha E, Hwang F |
46 - 51 |
Towards on-chip clocking of perpendicular Nanomagnetic Logic Becherer M, Kiermaier J, Breitkreutz S, Eichwald I, Ziemys G, Csaba G, Schmitt-Landsiedel D |
52 - 58 |
Fabrication of pseudo-spin-MOSFETs using a multi-project wafer CMOS chip Nakane R, Shuto Y, Sukegawa H, Wen ZC, Yamamoto S, Mitani S, Tanaka M, Inomata K, Sugahara S |
59 - 68 |
Color recognition sensor in standard CMOS technology Batistell G, Zhang VC, Sturm J |
69 - 75 |
A study on HfO2 RRAM in HRS based on I-V and RTN analysis Puglisi FM, Pavan P, Padovani A, Larcher L |
76 - 81 |
Compact modeling of STT-MTJ devices Xu ZH, Yang CG, Mao MQ, Sutaria KB, Chakrabarti C, Cao Y |
82 - 86 |
Performance evaluation of parallel electric field tunnel field-effect transistor by a distributed-element circuit model Morita Y, Mori T, Migita S, Mizubayashi W, Tanabe A, Fukuda K, Matsukawa T, Endo K, O'uchi S, Liu YX, Masahara M, Ota H |
87 - 92 |
Integration techniques of pHEMTs and planar Gunn diodes on GaAs substrates Papageorgiou V, Khalid A, Li C, Steer MJ, Cumming DRS |
93 - 97 |
Impact of T-gate stem height on parasitic gate delay time in InGaAs-HEMTs Yoshida T, Kobayashi K, Otsuji T, Suemitsu T |