검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Infrared spectroscopic ellipsometry of micrometer-sized SiO2 line gratings Walder C, Zellmeier M, Rappich J, Ketelsen H, Hinrichs K Applied Surface Science, 416, 397, 2017 |
| 2 |
Spectroscopic ellipsometry on sinusoidal surface-relief gratings Antos R, Ohlidal I, Franta D, Klapetek P, Mistrik J, Yamaguchi T, Visnovsky S Applied Surface Science, 244(1-4), 221, 2005 |
| 3 |
Spectroscopic ellipsometry on lamellar gratings Antos R, Ohlidal I, Mistrik J, Murakami K, Yamaguchi T, Pistora J, Horie M, Visnovsky S Applied Surface Science, 244(1-4), 225, 2005 |