검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Highly uniform epitaxial SiC-layers grown in a hot-wall CVD reactor with mechanical rotation Schoner A, Konstantinov A, Karlsson S, Berge R Materials Science Forum, 389-3, 187, 2002 |
| 2 |
Non-destructive optical depth profiling and real-time evaluation of spectroscopic data Fried M, Redei L Thin Solid Films, 364(1-2), 64, 2000 |