검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Self-focusing SIMS: A metrology solution to area selective deposition Spampinato V, Armini S, Franquet A, Cunard T, van der Heide P, Vandervorst W Applied Surface Science, 476, 594, 2019 |
| 2 |
Efficient automatic noise reduction of electron tomographic reconstructions based on iterative median filtering van der Heide P, Xu XP, Marsh BJ, Hanein D, Volkmann N Journal of Structural Biology, 158(2), 196, 2007 |
| 3 |
Radiation enhanced diffusion of Ti in Al2O3 Weiss M, Lu M, van der Heide P, Lee SM, Ada E, Lee HS, Rabalais JW Journal of Chemical Physics, 113(12), 5058, 2000 |