검색결과 : 13건
| No. | Article |
|---|---|
| 1 |
Formation process of graphite film on Ni substrate with improved thickness uniformity through precipitation control Kim SG, Hu Q, Nam KB, Kim MJ, Yoo JB Chemical Physics Letters, 698, 157, 2018 |
| 2 |
Characterization of wafer-scale MoS2 and WSe2 2D films by spectroscopic ellipsometry Diware MS, Park K, Mun J, Park HG, Chegal W, Cho YJ, Cho HM, Park J, Kim H, Kang SW, Kim YD Current Applied Physics, 17(10), 1329, 2017 |
| 3 |
High uniform growth of 4-inch GaN wafer via flow field optimization by HVPE Cheng YT, Liu P, Wu JJ, Xiang Y, Chen XJ, Ji C, Yu TJ, Zhang GY Journal of Crystal Growth, 445, 24, 2016 |
| 4 |
Improvement of wall thickness uniformity of thick-walled polystyrene shells by density matching Liu MF, Chen SF, Qi XB, Li B, Shi RT, Liu YY, Chen YP, Zhang ZW Chemical Engineering Journal, 241, 466, 2014 |
| 5 |
Highly uniform growth of 2-inch GaN wafers with a multi-wafer HVPE system Liu NL, Wu JJ, Li WH, Luo RH, Tong YZ, Zhang GY Journal of Crystal Growth, 388, 132, 2014 |
| 6 |
열화학증기증착법을 이용한 그래핀의 합성 및 투과전자현미경 관찰용 그리드 멤브레인으로의 응용 이병주, 정구환 Korean Journal of Materials Research, 22(3), 130, 2012 |
| 7 |
무전해 동도금 Throwing Power (TP) 및 두께 편차 개선 서정욱, 이진욱, 원용선 Clean Technology, 17(2), 103, 2011 |
| 8 |
다중소스 진공증착법에서의 대면적 박막균일도에 관한 전산모사 연구 김창규, 이원종 Korean Journal of Materials Research, 21(1), 56, 2011 |
| 9 |
Composition and thickness distribution of HgCdTe molecular beam epitaxy wafers by infrared microscope mapping Chang Y, Badano G, Jiang E, Garland JW, Zhao J, Grein CH, Sivananthan S Journal of Crystal Growth, 277(1-4), 78, 2005 |
| 10 |
Development of Cat-CVD apparatus for 1-m-size large-area deposition Ishibashi K, Karasawa M, Xu G, Yokokawa N, Ikemoto M, Masuda A, Matsumura H Thin Solid Films, 430(1-2), 58, 2003 |