검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Makyoh-topography study of the swirl defect in Si wafers Riesz F, Pap AE, Adam M, Lukacs IE Thin Solid Films, 516(22), 8087, 2008 |
| 2 |
Tentative analysis of Swirl defects in silicon crystals Fan TW, Qian JJ, Wu J, Lin LY, Yuan J Journal of Crystal Growth, 213(3-4), 276, 2000 |