검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
Influence of non-Gaussian roughness on sputter depth profiles Liu Y, Jian W, Wang JY, Hofmann S, Kovac J Applied Surface Science, 276, 447, 2013 |
| 2 |
Development of an ion-beam sputtering system for depositing thin films and multilayers of alloys and compounds Gupta M, Gupta A, Phase DM, Chaudhari SM, Dasannacharya BA Applied Surface Science, 205(1-4), 309, 2003 |
| 3 |
In-situ determination of interface roughness in MOVPE-grown visible VCSELs by reflectance spectroscopy Haberland K, Zorn M, Klein A, Bhattacharya A, Weyers M, Zettler JT, Richter W Journal of Crystal Growth, 248, 194, 2003 |
| 4 |
Dependence of structural features on substrates in Co/Cu multilayers Li PQ, Shen HL, Saitoh Y, Fujimoto T, Kojima I Thin Solid Films, 315(1-2), 104, 1998 |