화학공학소재연구정보센터
검색결과 : 29건
No. Article
1 Correlation between molecular secondary ion yield and cluster ion sputtering for samples with different stopping powers
Heile A, Muhmann C, Lipinsky D, Arlinghaus HF
Applied Surface Science, 258(18), 6993, 2012
2 G-SIMS and SMILES: Simulated fragmentation pathways for identification of complex molecules, amino acids and peptides
Green FM, Gilmore IS, Seah MP
Applied Surface Science, 255(4), 852, 2008
3 Primary ion fluence dependence in time-of-flight SIMS of self-assembled monolayer of alkyl thiol molecules on Au(111)-Discussion of static limit
Ghonaim NW, Nieradko M, Xi L, Nie HY, Francis JT, Grizzi O, Yeung KKC, Lau LWM
Applied Surface Science, 255(4), 1029, 2008
4 Mapping hard magnetic recording disks by TOF-SIMS
Spool A, Forrest J
Applied Surface Science, 255(4), 1482, 2008
5 Topography and field effects in the quantitative analysis of conductive surfaces using ToF-SIMS
Lee JLS, Gilmore IS, Fletcher IW, Seah MP
Applied Surface Science, 255(4), 1560, 2008
6 Probing thin over layers with variable energy/cluster ion beams
Spool A, White R
Applied Surface Science, 252(19), 6517, 2006
7 Mass accuracy- TOF-SIMS
Green FM, Gilmore IS, Seah MP
Applied Surface Science, 252(19), 6591, 2006
8 G-SIMS-FPM: Molecular structure at surfaces- a combined positive and negative secondary ion study
Gilmore IS, Green FM, Seah MP
Applied Surface Science, 252(19), 6601, 2006
9 G-SIMS of thermosetting polymers
Hawtin PN, Abel ML, Watts JF, Powell J
Applied Surface Science, 252(19), 6676, 2006
10 G-SIMS of biodegradable homo-polyesters
Ogaki R, Green F, Li S, Vert M, Alexander MR, Gilmore IS, Davies MC
Applied Surface Science, 252(19), 6797, 2006