검색결과 : 29건
No. | Article |
---|---|
1 |
Correlation between molecular secondary ion yield and cluster ion sputtering for samples with different stopping powers Heile A, Muhmann C, Lipinsky D, Arlinghaus HF Applied Surface Science, 258(18), 6993, 2012 |
2 |
G-SIMS and SMILES: Simulated fragmentation pathways for identification of complex molecules, amino acids and peptides Green FM, Gilmore IS, Seah MP Applied Surface Science, 255(4), 852, 2008 |
3 |
Primary ion fluence dependence in time-of-flight SIMS of self-assembled monolayer of alkyl thiol molecules on Au(111)-Discussion of static limit Ghonaim NW, Nieradko M, Xi L, Nie HY, Francis JT, Grizzi O, Yeung KKC, Lau LWM Applied Surface Science, 255(4), 1029, 2008 |
4 |
Mapping hard magnetic recording disks by TOF-SIMS Spool A, Forrest J Applied Surface Science, 255(4), 1482, 2008 |
5 |
Topography and field effects in the quantitative analysis of conductive surfaces using ToF-SIMS Lee JLS, Gilmore IS, Fletcher IW, Seah MP Applied Surface Science, 255(4), 1560, 2008 |
6 |
Probing thin over layers with variable energy/cluster ion beams Spool A, White R Applied Surface Science, 252(19), 6517, 2006 |
7 |
Mass accuracy- TOF-SIMS Green FM, Gilmore IS, Seah MP Applied Surface Science, 252(19), 6591, 2006 |
8 |
G-SIMS-FPM: Molecular structure at surfaces- a combined positive and negative secondary ion study Gilmore IS, Green FM, Seah MP Applied Surface Science, 252(19), 6601, 2006 |
9 |
G-SIMS of thermosetting polymers Hawtin PN, Abel ML, Watts JF, Powell J Applied Surface Science, 252(19), 6676, 2006 |
10 |
G-SIMS of biodegradable homo-polyesters Ogaki R, Green F, Li S, Vert M, Alexander MR, Gilmore IS, Davies MC Applied Surface Science, 252(19), 6797, 2006 |