검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
Three dimensional imaging using secondary ion mass spectrometry and atomic force microscopy Fleming Y, Wirtz T, Gysin U, Glatzel T, Wegmann U, Meyer E, Maier U, Rychen J Applied Surface Science, 258(4), 1322, 2011 |
| 2 |
Range evaluation in SIMS depth profiles of Er-implantations in silicon Mayerhofer K, Foisner H, Piplits K, Hobler G, Palmetshofer L, Hutter H Applied Surface Science, 252(1), 271, 2005 |
| 3 |
On the reliability of SIMS depth profiles through HfO2-stacks Vandervorst W, Bennett J, Huyghebaert C, Conard T, Gondran C, De Witte H Applied Surface Science, 231-2, 569, 2004 |
| 4 |
Transient effects induced through ripple topography growth during Cs+ depth profile analysis of Si at high incidence angles van der Heide PAW, Lima MS, Perry SS, Bennett J Applied Surface Science, 203, 156, 2003 |