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| No. | Article |
|---|---|
| 1 |
Spherical aberration corrected STEM studies of Ge nanodots grown on Si(001) surfaces with an ultrathin SiO2 coverage Tanaka N, Cho SP, Shklyaev AA, Yamasaki J, Okunishi E, Ichikawa M Applied Surface Science, 254(23), 7569, 2008 |