1 |
Stress measurement in coarse grained material with high-resolution X-ray beams Ortner B Thin Solid Films, 530, 77, 2013 |
2 |
Determination of Young's modulus and Poisson's ratio of thin films by combining sin(2)psi X-ray diffraction and laser curvature methods Chang JY, Yu GP, Huang JH Thin Solid Films, 517(24), 6759, 2009 |
3 |
Determination of residual stress fields with high local resolution Hasse B, Kocak M, Reimers W Materials Science Forum, 524-525, 279, 2006 |
4 |
Plastic heterogeneities characterisation in 16MND5 RPV steel by X-Ray diffraction, comparison with Finite-Elements approach Mathieu JP, Bouscaud D, Inal K, Berveiller S, Diard O Materials Science Forum, 524-525, 523, 2006 |
5 |
Stress determination during the mechanically-induced martensite phase transformation in the superelastic alloy CuAIBe by neutron diffraction Malard B, Pirling T, Inal K, Patoor E, Berveiller S Materials Science Forum, 524-525, 905, 2006 |
6 |
Residual stress measurement in textured thin film by grazing-incidence X-ray diffraction Ma CH, Huang JH, Chen H Thin Solid Films, 418(2), 73, 2002 |
7 |
Distribution of residual stresses in the surface layers of carbon steels after laser treatment Danil'chenko VE, Polchuk B Materials Science Forum, 378-3, 443, 2001 |
8 |
Measured stress concentration at a notch front in Si3N4 Tanaka SI Materials Science Forum, 347-3, 586, 2000 |