검색결과 : 15건
| No. | Article |
|---|---|
| 1 |
An effective thermal circuit model for electro-thermal simulation of SOI analog circuits Cheng MC, Zhang K Solid-State Electronics, 62(1), 48, 2011 |
| 2 |
Silicon on insulator MESFETs for RF amplifiers Wilk SJ, Balijepalli A, Ervin J, Lepkowski W, Thornton TJ Solid-State Electronics, 54(3), 336, 2010 |
| 3 |
Electrical and diffraction characterization of short and narrow MOSFETs on fully depleted strained silicon-on-insulator (sSOI) Baudot S, Andrieu F, Faynot O, Eymery J Solid-State Electronics, 54(9), 861, 2010 |
| 4 |
Variable temperature characterization of low-dimensional effects in tri-gate SOI MOSFETs Barrett C, Lederer D, Redmond G, Xiong W, Colinge JP, Quinn AJ Solid-State Electronics, 54(11), 1273, 2010 |
| 5 |
Fabrication and characterisation of high resistivity SOI substrates for monolithic high energy physics detectors Ruddell FH, Suder SL, Bain MF, Montgomery JH, Armstrong BM, Gamble HS, Denvir D, Casse G, Bowcock T, Allport PP, Marczewski J, Kucharski K, Tomaszewski D, Niemiec H, Kucewicz W Solid-State Electronics, 52(12), 1849, 2008 |
| 6 |
Analysis of STI-induced mechanical stress-related Kink effect of 40 nm PD SOI NMOS devices biased in saturation region Lin IS, Su VC, Kuo JB, Chen D, Yeh CS, Tsai CT, Ma M Solid-State Electronics, 52(12), 1884, 2008 |
| 7 |
Substrate bias and operating temperature effects on the performance of Schottky-barrier SOI nMOSFETs Ka DH, Shin JW, Cho WJ, Park JT Solid-State Electronics, 52(12), 1910, 2008 |
| 8 |
Bulk and surface micromachined MEMS in thin film SOI technology Raskin JP, Iker F, Andre N, Olbrechts B, Pardoen T, Flandre D Electrochimica Acta, 52(8), 2850, 2007 |
| 9 |
Some issues of hot-carrier degradation and negative bias temperature instability of advanced SOICMOS transistors Ioannou DP, Ioannou DE Solid-State Electronics, 51(2), 268, 2007 |
| 10 |
Dose radiation effects in FinFETs Wu XS, Chan PCH, Orozco A, Vazquez A, Chaudhry A, Colinge JP Solid-State Electronics, 50(2), 287, 2006 |