검색결과 : 270건
| No. | Article |
|---|---|
| 1 |
Al2O3/Si0.7Ge0.3(001) & HfO2/Si(0.7)Ge0.3(001) interface trap state reduction via in-situ N-2/H-2 RF downstream plasma passivation Breeden M, Wolf S, Ueda S, Fang ZW, Chang CY, Tang KC, McIntyre P, Kummel AC Applied Surface Science, 478, 1065, 2019 |
| 2 |
SiGe films and graded buffers grown by liquid phase epitaxy from different growth solution compositions Wang J, Quitoriano NJ Journal of Crystal Growth, 510, 65, 2019 |
| 3 |
DC Current-crowding estimation for SiGe:C heterojunction bipolar transistors Ramirez-Garcia E, Garduno-Nolasco E, Rodriguez-Mendez LM, Diaz-Albarran LM, Valdez-Perez D, Galaz-Larios MC, Aniel F, Zerounian N, Enciso-Aguilar MA Solid-State Electronics, 153, 1, 2019 |
| 4 |
Laser-induced aluminium-assisted crystallization of Ge-rich SixGe1-x epitaxy on Si Liu ZH, Hao XJ, Huang JL, Ho-Baillie A, Green MA Thin Solid Films, 679, 55, 2019 |
| 5 |
Diffusion and reaction kinetics governing surface blistering in radio frequency sputtered hydrogenated a-SixGe1-x (0 <= x <= 1) thin films Serenyi M, Csik A, Hamori A, Kalas B, Lukacs I, Zolnai ZS, Frigeri C Thin Solid Films, 679, 58, 2019 |
| 6 |
Growth evolution of SiGe graded buffers during LPE cooling process Wang J, Shen YJ, Quitoriano N Journal of Crystal Growth, 502, 54, 2018 |
| 7 |
Formation of crystalline silicon-germanium thin films on silicon substrates by solid phase crystallization Hamdoh A, Kaneko T, Isomura M Thin Solid Films, 645, 203, 2018 |
| 8 |
Performance control for amorphous silicon germanium alloys by in situ optical emission spectroscopy Wang GH, Shi CY, Zhao L, Mo LB, Diao HW, Wang WJ Thin Solid Films, 659, 36, 2018 |
| 9 |
Spectroscopic imaging ellipsometry of self-assembled SiGe/Si nanostructures. Alonso MI, Funke S, Gonzalez A, Garriga M, Vaccaro PO, Goni AR, Ruiz A, Alonso M, Thiesen PH Applied Surface Science, 421, 547, 2017 |
| 10 |
Spectroscopic ellipsometry and X-ray diffraction studies on Si1-xGex/Si epifilms and superlattices Xie D, Qiu ZR, Wan LY, Talwar DN, Cheng HH, Liu SY, Mei T, Feng ZC Applied Surface Science, 421, 748, 2017 |