검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
SOI technology characterization using SOI-MOS capacitor Sonnenberg V, Martino JA Solid-State Electronics, 49(1), 109, 2005 |
| 2 |
Simultaneous extraction of the silicon film and front oxide thicknesses on fully depleted SOI nMOSFETs Nicolett AS, Martino JA, Simoen E, Claeys C Solid-State Electronics, 44(11), 1961, 2000 |
| 3 |
Ellipsometric analysis of polysilicon layers Gruska B Thin Solid Films, 364(1-2), 138, 2000 |