검색결과 : 5건
| No. | Article |
|---|---|
| 1 |
Six months repeatability of D-SIMS depth profile using an ultra-low-energy probe Li ZP, Hoshi T, Oiwa R Applied Surface Science, 203, 318, 2003 |
| 2 |
Characteristics of ultra-low-energy Cs+ ion beam bombardments Li ZP, Hoshi T, Oiwa R Applied Surface Science, 203, 323, 2003 |
| 3 |
SIMS backside depth profiling of ultra shallow implants Yeo KL, Wee ATS, See A, Liu R, Ng CM Applied Surface Science, 203, 335, 2003 |
| 4 |
Comparison between Xe+ and O-2(+) primary ions, at low impact energy, on B delta-doping, SiGe-Si superlattice and Al/Ti multilayer structures Laugier F, Holliger P, Dupuy JC, Baboux N Applied Surface Science, 203, 348, 2003 |
| 5 |
LEXES and SIMS as complementary techniques for full quantitative characterization of nanometer structures Hombourger C, Staub R, Schuhmacher M, Desse F, de Chambost E, Hitzman C Applied Surface Science, 203, 383, 2003 |