| 1 |
Tof-sims Investigation of Epoxy Resin Curing Reaction at Different Resin to Hardener Ratios
Awaja F, van Riessen G, Kelly G, Fox B, Pigram PJ
Journal of Applied Polymer Science, 110(5), 2711, 2008 |
| 2 |
XPS and ToF-SIMS analysis of natural rubies and sapphires heated in an inert (N-2) atmosphere
Achiwawanich S, James BD, Liesegang J
Applied Surface Science, 253(16), 6883, 2007 |
| 3 |
Strong composition-dependent variation of MCs+ calibration factors in TiOx and GeOx (x <= 2) films
Gnaser H, Le YK, Su WF
Applied Surface Science, 252(19), 7054, 2006 |
| 4 |
Utilization of electron impact ionization of gaseous and sputtered species in the secondary ion acceleration region of a magnetic sector SIMS instrument
Pivovarov A, Gu C, Stevie F, Griffis D
Applied Surface Science, 231-2, 781, 2004 |
| 5 |
SIMS study of self-consisted fractionation of iron and titanium isotopes in ilmenites
Didenko PI, Efremov AA
Applied Surface Science, 231-2, 903, 2004 |
| 6 |
The energy spectra of secondary ions sputtered from Si and SiGe by ultra-low-energy primary ions
Bellingham J, Dowsett MG
Applied Surface Science, 203, 130, 2003 |
| 7 |
Kiloelectronvolt particle-induced emission and fragmentation of polystyrene molecules adsorbed on silver: Insights from molecular dynamics
Delcorte A, Vanden Eynde X, Bertrand P, Vickerman JC, Garrison BJ
Journal of Physical Chemistry B, 104(12), 2673, 2000 |
| 8 |
Diploma - An Experimental System to Study MeV and keV Particle-Induced and Photon-Induced Desorption of Molecules
Brinkmalm G, Hakansson P, Kjellberg J, Sundqvist BU
Journal of Vacuum Science & Technology A, 13(5), 2547, 1995 |
