| 1 |
Quantitative reconstruction of the GDOES sputter depth profile of a monomolecular layer structure of thiourea on copper
Liu Y, Jian W, Wang JY, Hofmann S, Shimizu K
Applied Surface Science, 331, 140, 2015 |
| 2 |
Analytical and numerical depth resolution functions in sputter profiling
Hofmann S, Liu Y, Wang JY, Kovac J
Applied Surface Science, 314, 942, 2014 |
| 3 |
Improved depth resolution of secondary ion mass spectrometry profiles in diamond: A quantitative analysis of the delta-doping
Fiori A, Jomard F, Teraji T, Chicot G, Bustarret E
Thin Solid Films, 557, 222, 2014 |
| 4 |
Deconvolution of very low primary energy SIMS depth profiles2w
Fares B, Gautier B, Dupuy JC, Prudon G, Holliger P
Applied Surface Science, 252(19), 6478, 2006 |
| 5 |
Deconvolution analysis of dopant depth profile of Si at AlGaAs/GaAs interface using Al composition profile as reference
Kawashima Y, Ide T, Aoyagi S, Kudo M
Applied Surface Science, 231-2, 800, 2004 |
| 6 |
Line broadening analysis using FullProf*: Determination of microstructural properties
Rodriguez-Carvajal J, Roisnel T
Materials Science Forum, 443-4, 123, 2004 |
| 7 |
Development and application of the Ghent pulsed positron beam
De Baerdemaeker J, Dauwe C
Applied Surface Science, 194(1-4), 52, 2002 |
| 8 |
Experimental study of the resolution function of a texture diffractometer
Machajdik D, Pevala A, Frohlich K, Weiss F, Figueras A
Materials Science Forum, 378-3, 235, 2001 |
| 9 |
Profile reconstruction in sputter depth profiling
Hofmann S
Thin Solid Films, 398-399, 336, 2001 |
