검색결과 : 7건
No. | Article |
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1 |
Optical properties of diamond-like carbon films containing SiOx studied by the combined method of spectroscopic ellipsometry and spectroscopic reflectometry Franta D, Ohlidal I, Bursikova V, Zajickova L Thin Solid Films, 455-56, 393, 2004 |
2 |
In situ reflectance difference spectroscopy of p-type ZnTe : N grown by MBE Stifter D, Bonanni A, Garcia-Rocha M, Schmid M, Hingerl K, Sitter H Thin Solid Films, 373(1-2), 41, 2000 |
3 |
Optical spectroscopy of near-surface excitonic states Azucena-Coyotecatl H, Grigorieva NR, Kazennov BA, Madrigal-Melchor J, Novikov BV, Perez-Rodriguez F, Sel'kin AV Thin Solid Films, 373(1-2), 227, 2000 |
4 |
Detection of cobalt silicide phase formations by ultrafast optical measurements Lavoie C, Cabral C, Harper JME, Tas G, Morath CJ, Stoner RJ, Maris HJ Thin Solid Films, 374(1), 42, 2000 |
5 |
An absorbing fractal film set Li Y, He DR Thin Solid Films, 375(1-2), 188, 2000 |
6 |
Driving force controlling liquid crystal alignment on photochromic polyion complex LB film Kawai T Thin Solid Films, 352(1-2), 228, 1999 |
7 |
FTIR reflection absorption spectroscopy for organic thin film on ITO substrate Tamada M, Koshikawa H, Hosoi F, Suwa T Thin Solid Films, 315(1-2), 40, 1998 |