| 1 |
Optical gradients in a-Si:H thin films detected using real-time spectroscopic ellipsometry with virtual interface analysis
Junda MM, Gautam LK, Collins RW, Podraza NJ
Applied Surface Science, 436, 779, 2018 |
| 2 |
Applications of real-time and mapping spectroscopic ellipsometry for process development and optimization in hydrogenated silicon thin-film photovoltaics technology
Dahal LR, Li J, Stoke JA, Huang ZQ, Shan A, Ferlauto AS, Wronski CR, Collins RW, Podraza NJ
Solar Energy Materials and Solar Cells, 129, 32, 2014 |
| 3 |
Real time spectroscopic ellipsometry for analysis and control of thin film polycrystalline semiconductor deposition in photovoltaics
Koirala P, Attygalle D, Aryal P, Pradhan P, Chen J, Marsillac S, Ferlauto AS, Podraza NJ, Collins R
Thin Solid Films, 571, 442, 2014 |
| 4 |
Real time spectroscopic ellipsometry of Ag/ZnO and Al/ZnO interfaces for back-reflectors in thin film Si:H photovoltaics
Dahal LR, Sainju D, Podraza NJ, Marsillac S, Collins RW
Thin Solid Films, 519(9), 2682, 2011 |
| 5 |
A broadband analysis of the optical properties of silver nanoparticle films by in situ real time spectroscopic ellipsometry
Marsillac S, Little SA, Collins RW
Thin Solid Films, 519(9), 2936, 2011 |
| 6 |
Application of spectral and temporal weighted error functions for data analysis in real-time spectroscopic ellipsometry
Zapien JA, Ferlauto AS, Collins RW
Thin Solid Films, 455-56, 106, 2004 |
| 7 |
Evaluation of compositional depth profiles in mixed-phase (amorphous plus crystalline) silicon films from real time spectroscopic ellipsometry
Ferlauto AS, Ferreira GM, Koval RJ, Pearce JM, Wronski CR, Collins RW, Al-Jassim MM, Jones KM
Thin Solid Films, 455-56, 665, 2004 |
| 8 |
Real-time studies of amorphous and microcrystalline Si : H growth by spectroscopic ellipsometry and infrared spectroscopy
Fujiwara H, Kondo M, Matsuda A
Thin Solid Films, 455-56, 670, 2004 |
| 9 |
Monitoring photodeposition of polymer films from diacetylene monomer solutions using in situ real-time spectroscopic ellipsometry
Hui D, Kim JS, Kim YT, An I, Paley MS
Thin Solid Films, 437(1-2), 127, 2003 |
| 10 |
Real time spectroscopic ellipsometry monitoring of the SiC growth during the interaction process of elemental carbon with Si surfaces
Wohner T, Cimalla V, Stauden T, Schaefer JA, Pezoldt J
Thin Solid Films, 364(1-2), 28, 2000 |
