검색결과 : 1건
No. | Article |
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1 |
Study on indentation-sliding contact conditions between semiconductor terminal and electrically testing probes Saiki H, Marumo Y, Ruan LQ, Haraguchi R, Moriyama M Materials Science Forum, 505-507, 295, 2006 |
No. | Article |
---|---|
1 |
Study on indentation-sliding contact conditions between semiconductor terminal and electrically testing probes Saiki H, Marumo Y, Ruan LQ, Haraguchi R, Moriyama M Materials Science Forum, 505-507, 295, 2006 |