검색결과 : 1건
No. | Article |
---|---|
1 |
In situ characterization of boron nitride layer growth by polarized FTIR reflection spectroscopy Scheible P, Lunk A Thin Solid Films, 364(1-2), 40, 2000 |
No. | Article |
---|---|
1 |
In situ characterization of boron nitride layer growth by polarized FTIR reflection spectroscopy Scheible P, Lunk A Thin Solid Films, 364(1-2), 40, 2000 |