검색결과 : 11건
| No. | Article |
|---|---|
| 1 |
Ellipsometric characterisation of thin films non-uniform in thickness Necas D, Franta D, Bursikova V, Ohlidal I Thin Solid Films, 519(9), 2715, 2011 |
| 2 |
Detection and characterization of single nanoparticles by interferometric phase modulated ellipsometry Barroso F, Bosch S, Tort N, Arteaga O, Sancho-Parramon J, Jover E, Bertran E, Canillas A Thin Solid Films, 519(9), 2801, 2011 |
| 3 |
Interactions between bottle-brush polyelectrolyte layers: Effects of ionic strength and oppositely charged surfactant Naderi A, Makuska R, Claesson PM Journal of Colloid and Interface Science, 323(1), 191, 2008 |
| 4 |
Phase-modulated spectroscopic ellipsometry and polarized transmission intensity studies of wide-gap biaxial CaGa2S4 Shim YG, Mamedov N, Yamamoto N Thin Solid Films, 455-56, 244, 2004 |
| 5 |
Adhesion improvement of plasma-deposited silica thin films on stainless steel substrate studied by x-ray photoemission spectroscopy and in situ infrared ellipsometry Bertrand N, Drevillon B, Gheorghiu A, Senemaud C, Martinu L, Klemberg-Sapieha JE Journal of Vacuum Science & Technology A, 16(1), 6, 1998 |
| 6 |
In situ infrared ellipsometry study of the growth of plasma deposited silica thin films Bertrand N, Drevillon B, Bulkin P Journal of Vacuum Science & Technology A, 16(1), 63, 1998 |
| 7 |
Spectroscopic ellipsometry in the infrared range Drevillon B Thin Solid Films, 313-314, 625, 1998 |
| 8 |
In situ infrared ellipsometry study of the growth of hydrogenated amorphous carbon thin films Heitz T, Drevillon B Thin Solid Films, 313-314, 704, 1998 |
| 9 |
Adhesion mechanisms of silica layers on plasma-treated polymers .1. Polycarbonate Vallon S, Hofrichter A, Guyot L, Drevillon B, KlembergSapieha JE, Martinu L, PoncinEpaillard F Journal of Adhesion Science and Technology, 10(12), 1287, 1996 |
| 10 |
Argon Plasma Treatment of Polycarbonate - In-Situ Spectroellipsometry Study and Polymer Characterizations Vallon S, Drevillon B, Poncinepaillard F, Klembergsapieha JE, Martinu L Journal of Vacuum Science & Technology A, 14(6), 3194, 1996 |