화학공학소재연구정보센터
검색결과 : 3건
No. Article
1 Site-specific SIMS backside analysis
Gu C, Garcia R, Pivovarov A, Stevie F, Griffis D
Applied Surface Science, 231-2, 663, 2004
2 Selective titanium silicide deposition using SiH4-TiCl4-H-2 low-pressure chemical vapor deposition and film characterization
Byun JS, Choi SJ, Kim JJ, Choi JT, Swenberg J, Achutharaman R
Journal of the Electrochemical Society, 145(11), 3941, 1998
3 High-Aspect-Ratio Contacts - A Review of the Current Tungsten Plug Process
Ireland PJ
Thin Solid Films, 304(1-2), 1, 1997