| 1 |
Chemo-mechanical coupling model of solid oxide fuel cell under high-temperature oxidation
Chen YP, Hao WQ, Wang FH
International Journal of Energy Research, 44(8), 7068, 2020 |
| 2 |
Stress Induced by Electrolyte Anion Incorporation in Porous Anodic Aluminum Oxide
Capraz OO, van Overmeere Q, Shrotriya P, Hebert KR
Electrochimica Acta, 238, 368, 2017 |
| 3 |
Role of Oxide Stress in the Initial Growth of Self-Organized Porous Aluminum Oxide
Capraz OO, Shrotriya P, Skeldon P, Thompson GE, Hebert KR
Electrochimica Acta, 167, 404, 2015 |
| 4 |
Stress-corrosion cracking of indium tin oxide coated polyethylene terephthalate for flexible optoelectronic devices
Sierros KA, Morris NJ, Ramji K, Cairns DR
Thin Solid Films, 517(8), 2590, 2009 |
| 5 |
The influence of temperature and dielectric materials on stress induced voiding in Cu dual damascene interconnects
Gan ZG, Shao W, Mhaisalkar SG, Chen Z, Li HY
Thin Solid Films, 504(1-2), 161, 2006 |
| 6 |
A general bulk-limited transport analysis of a 10 nm-thick oxide stress-induced leakage current
De Salvo B, Ghibaudo G, Pananakakis G, Guillaumot B, Reimbold G
Solid-State Electronics, 44(6), 895, 2000 |
| 7 |
Radiation and electrical stress-induced hole trap-assisted tunneling currents in ultrathin gate oxides
Ang CH, Ling CH, Cho BJ, Kim SJ, Cheng ZY
Solid-State Electronics, 44(11), 2001, 2000 |
