검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Characterization of oxide films on SIC epitaxial (000-1) faces by angle-resolved photoemission spectroscopy measurements using synchrotron radiation Hijikata A, Yaguchi B, Yoshida S, Takata Y, Kobayashi K, Shin S, Nohira H, Hattori T Materials Science Forum, 483, 585, 2005 |
| 2 |
Photoemission spectroscopic studies on oxide/SiC interfaces formed by dry and pyrogenic oxidation Hijikata Y, Yaguchi H, Ishida Y, Yoshikawa M, Kamiya T, Yoshida S Materials Science Forum, 457-460, 1341, 2004 |