| 1 |
Highly Precise Determination of Structural and Optical Parameters of an Innovative (PVA-VOCl) for Flexible Polymer-Semiconductor Devices
Ali FM, Maiz F
Macromolecular Research, 28(9), 805, 2020 |
| 2 |
Impact of rough silicon buffer layer on electronic quality of GaAs grown on Si substrate
Azeza B, Ezzedini M, Zaaboub Z, M'ghaieth R, Sfaxi L, Hassen F, Maaref H
Current Applied Physics, 12(5), 1256, 2012 |
| 3 |
Sputtered hydrogenated amorphous silicon thin films for distributed Bragg reflectors and long wavelength vertical cavity surface emitting lasers applications
Shuaib A, Levallois C, Gauthier JP, Paranthoen C, Durand O, Cornet C, Chevalier N, Le Corre A
Thin Solid Films, 519(18), 6178, 2011 |
| 4 |
Effective optical properties of highly ordered mesoporous thin films
Hutchinson NJ, Coquil T, Navid A, Pilon L
Thin Solid Films, 518(8), 2141, 2010 |
| 5 |
Precise etch-depth control of microlens-integrated intracavity contacted vertical-cavity surface-emitting lasers by in-situ laser reflectometry and reflectivity modeling
Song YM, Chang KS, Na BH, Yu JS, Lee YT
Thin Solid Films, 517(19), 5773, 2009 |
| 6 |
Optimization of multiple layer semiconductor waveguides
Calian V, Stoenescu G, Ursache M, Socaciu M, Rotaru P
Thin Solid Films, 474(1-2), 197, 2005 |
