| 1 |
Spectroscopic ellipsometry data analysis using penalized splines representation for the dielectric function
Likhachev DV
Thin Solid Films, 669, 174, 2019 |
| 2 |
Rough surface characterization using off-axis digital holographic microscopy compensated with self-hologram rotation
Ibrahim DGA
Current Applied Physics, 18(11), 1261, 2018 |
| 3 |
New dispersion model for band gap tracking
Malkova N, Poslavsky L, Di M, Hu DW, Zhao Q
Thin Solid Films, 595, 32, 2015 |
| 4 |
A practitioner's approach to evaluation strategy for ellipsometric measurements of multilayered and multiparametric thin-film structures
Likhachev DV
Thin Solid Films, 595, 113, 2015 |
| 5 |
A practical method for optical dispersion model selection and parameters variations in scatterometry analysis with variable n&k's
Likhachev DV
Thin Solid Films, 562, 90, 2014 |
| 6 |
Application of neural classification in ellipsometry for robust thin-film characterizations
Gereige I, Robert S
Thin Solid Films, 518(15), 4091, 2010 |
| 7 |
Scatterometry measurement of ingaasp/inp grating for DFB lasers grown with MOVPE
Muroya Y, Katoh H, Makino S, Okuda T, Ishikawa S, Komatsu K
Journal of Crystal Growth, 299(1), 11, 2007 |
| 8 |
Spectroscopic ellipsometry on sinusoidal surface-relief gratings
Antos R, Ohlidal I, Franta D, Klapetek P, Mistrik J, Yamaguchi T, Visnovsky S
Applied Surface Science, 244(1-4), 221, 2005 |
| 9 |
Spectroscopic ellipsometry on lamellar gratings
Antos R, Ohlidal I, Mistrik J, Murakami K, Yamaguchi T, Pistora J, Horie M, Visnovsky S
Applied Surface Science, 244(1-4), 225, 2005 |
