| 1 |
Effect of substitution group variation on the optical functions of-5-sulfono-7-(4-x phenyl azo)-8-hydroxy quinoline thin films
Zeyada HM, El-Ghamaz NA, Gaml EA
Current Applied Physics, 13(9), 1960, 2013 |
| 2 |
Relationships among surface processing at the nanometer scale, nanostructure and optical properties of thin oxide films
Losurdo M
Thin Solid Films, 455-56, 301, 2004 |
| 3 |
Temperature dependence of the optical functions of amorphous silicon-based materials: application to in situ temperature measurements by spectroscopic ellipsometry
Daineka D, Suendo V, Cabarrocas PRI
Thin Solid Films, 468(1-2), 298, 2004 |
| 4 |
Optical characterization of TiN/SiO2(1000 nm)/Si system by spectroscopic ellipsometry and reflectometry
Postava K, Aoyama M, Yamaguchi T
Applied Surface Science, 175, 270, 2001 |
| 5 |
Spectroellipsometric characterization of materials for multilayer coatings
Postava K, Aoyama M, Yamaguchi T, Oda H
Applied Surface Science, 175, 276, 2001 |
| 6 |
Metrology of sub-0.5 mu m silicon epitaxial films
Chen WZ, Reif R
Journal of Vacuum Science & Technology A, 16(4), 2330, 1998 |
| 7 |
Advances in multichannel spectroscopic ellipsometry
Collins RW, An I, Fujiwara H, Lee JC, Lu YW, Koh JY, Rovira PI
Thin Solid Films, 313-314, 18, 1998 |
| 8 |
Measurement of the absorption edge of thick transparent substrates using the incoherent reflection model and spectroscopic UV visible near IR ellipsometry
Kildemo M, Ossikovski R, Stchakovsky M
Thin Solid Films, 313-314, 108, 1998 |
| 9 |
Spectroscopic ellipsometry characterization of thin-film silicon nitride
Jellison GE, Modine FA, Doshi P, Rohatgi A
Thin Solid Films, 313-314, 193, 1998 |
| 10 |
Comparative study of polysilicon-on-oxide using spectroscopic ellipsometry, atomic force microscopy, and transmission electron microscopy
Petrik P, Fried M, Lohner T, Berger R, Biro LP, Schneider C, Gyulai J, Ryssel H
Thin Solid Films, 313-314, 259, 1998 |
