| 1 |
Simulated non-contact atomic force microscopy for GaAs surfaces based on real-space pseudopotentials
Kim M, Chelikowsky JR
Applied Surface Science, 303, 163, 2014 |
| 2 |
Mechanical distinction and manipulation of atoms based on noncontact atomic force microscopy
Morita S, Yi I, Sugimoto Y, Oyabu N, Nishi R, Custance O, Abe M
Applied Surface Science, 241(1-2), 2, 2005 |
| 3 |
KPFM imaging of Si(111)5 root 3 x 5 root 3-Sb surface for atom distinction using NC-AFM
Okamoto K, Yoshimoto K, Sugawara Y, Morita S
Applied Surface Science, 210(1-2), 128, 2003 |
| 4 |
Atom-resolved noncontact atomic force microscopic and scanning tunneling microscopic observations of the structure and dynamic behavior of CeO2(111) surfaces
Namai Y, Fukui KI, Iwasawa Y
Catalysis Today, 85(2-4), 79, 2003 |
| 5 |
Imaging of surface oxygen atoms and their defect structures on CeO2(111) by noncontact atomic force microscopy
Fukui K, Namai Y, Iwasawa Y
Applied Surface Science, 188(3-4), 252, 2002 |
| 6 |
Atomic resolution imaging of Si(100) 1 x 1 : 2H dihydride surface with noncontact atomic force microscopy (NC-AFM)
Araragi S, Yoshimoto A, Nakata N, Sugawara Y, Morita S
Applied Surface Science, 188(3-4), 272, 2002 |
| 7 |
Theoretical study on atomic and electronic structures of Ag-adsorbed SiNC-AFM tips
Motoda Y, Sasaki N, Watanabe S
Applied Surface Science, 188(3-4), 331, 2002 |
| 8 |
The elimination of the'artifact' in the electrostatic force measurement using a novel noncontact atomic force micro scope/electrostatic force microscope
Okamoto K, Sugawara Y, Morita S
Applied Surface Science, 188(3-4), 381, 2002 |
| 9 |
Noncontact atomic force microscopy in liquid environment with quartz tuning fork and carbon nanotube probe
Kageshima M, Jensenius H, Dienwiebel M, Nakayama Y, Tokumoto H, Jarvis SP, Oosterkamp TH
Applied Surface Science, 188(3-4), 440, 2002 |
| 10 |
Bias dependence of Si(111) 7 X 7 images observed by noncontact atomic force microscopy
Arai T, Tomitori M
Applied Surface Science, 157(4), 207, 2000 |
