검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Barrier layer model determined by XPS data for tunneling current reductions at monolayer nitrided Si-SiO2 interfaces Niimi H, Yang HY, Lucovsky G, Keister JW, Rowe JE Applied Surface Science, 166(1-4), 485, 2000 |
| No. | Article |
|---|---|
| 1 |
Barrier layer model determined by XPS data for tunneling current reductions at monolayer nitrided Si-SiO2 interfaces Niimi H, Yang HY, Lucovsky G, Keister JW, Rowe JE Applied Surface Science, 166(1-4), 485, 2000 |