| 1 |
Natural payload delivery of the doxorubicin anticancer drug from boron nitride oxide nanosheets
Duverger E, Balme S, Bechelany M, Miele P, Picaud F
Applied Surface Science, 475, 666, 2019 |
| 2 |
Characterization of Cu3N/CuO thin films derived from annealed Cu3N for electrode application in Li-ion batteries
Chen WH, Zhang H, Yang B, Li BC, Li ZC
Thin Solid Films, 672, 157, 2019 |
| 3 |
Properties of N-rich Silicon Nitride Film Deposited by Plasma-Enhanced Atomic Layer Deposition
Jhang PC, Lu CP, Shieh JY, Yang LW, Yang T, Chen KC, Lu CY
Solid-State Electronics, 133, 10, 2017 |
| 4 |
Improvements in the reliability of a-InGaZnO thin-film transistors with triple stacked gate insulator in flexible electronics applications
Chen HM, Chang TC, Tai YH, Chen KF, Chiang HC, Liu KH, Lee CK, Lin WT, Cheng CC, Tu CH, Liu CY
Thin Solid Films, 595, 176, 2015 |
| 5 |
Study of charge loss mechanisms for nano-sized localized trapping SONOS memory devices
Xu Y, Yue H, Zhao FF
Solid-State Electronics, 91, 118, 2014 |
| 6 |
Field-dependent charge trapping analysis of ONO inter-poly dielectrics for NAND flash memory applications
Moon P, Lim JY, Youn TU, Park SK, Yun I
Solid-State Electronics, 94, 51, 2014 |
| 7 |
Vapor-phase growth of high-quality GaN single crystals in crucible by carbothermal reduction and nitridation of Ga2O3
Miura A, Shimada S, Sekiguchi T, Yokoyama M, Mizobuchi B
Journal of Crystal Growth, 310(3), 530, 2008 |
| 8 |
Channel width dependence of hot electron injection program/hot hole erase cycling behavior in silicon-oxide-nitride-oxide-silicon (SONOS) memories
Seo SH, Kim SW, Lee JU, Kang GC, Roh KS, Kim KY, Lee SY, Choi CM, Song KJ, Park SR, Park JH, Jeon KC, Kim DM, Kim DH, Shin H, Lee JD, Park BG
Solid-State Electronics, 52(6), 844, 2008 |
| 9 |
High-performance polycrystalline silicon thin-film transistors with oxidenitride-oxide gate dielectric and multiple nanowire channels
Chen SC, Chang TC, Liu PT, Wu YC, Tsai CC, Chang TS, Lien CH
Thin Solid Films, 515(3), 1112, 2006 |
| 10 |
Profiling of deep traps in silicon oxide-nitride-oxide structures
Naich M, Rosenman G, Roizin Y
Thin Solid Films, 471(1-2), 166, 2005 |
