화학공학소재연구정보센터
검색결과 : 4건
No. Article
1 Dependence of micropipe dissociation on surface orientation
Kamata I, Tsuchida H, Izumi S, Tawara T, Izumi K
Materials Science Forum, 457-460, 379, 2004
2 Analysis for structural defects in the 4H-SiC epilayers and their influence on electrical properties
Izumi S, Kamata I, Tawara T, Fujisawa H, Tsuchida H
Materials Science Forum, 457-460, 1085, 2004
3 A comparative study of the electrical properties of 4H-SiC epilayers with continuous and dissociated micropipes
Kamata I, Tsuchida H, Jikimoto T, Izumi K
Materials Science Forum, 389-3, 1137, 2002
4 Conditions for micropipe dissociation by 4H-SiC CVD growth
Kamata I, Tsuchida H, Jikimoto T, Miyanagi T, Izumi K
Materials Science Forum, 433-4, 261, 2002