검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Characterisation of mesostructured TiO2 thin layers by ellipsometric porosimetry Rouessac V, Coustel R, Bosc F, Durand J, Ayral A Thin Solid Films, 495(1-2), 232, 2006 |
| No. | Article |
|---|---|
| 1 |
Characterisation of mesostructured TiO2 thin layers by ellipsometric porosimetry Rouessac V, Coustel R, Bosc F, Durand J, Ayral A Thin Solid Films, 495(1-2), 232, 2006 |