검색결과 : 4건
| No. | Article |
|---|---|
| 1 |
Model study of electron beam charge compensation for positive secondary ion mass spectrometry using a positive primary ion beam Zhu ZM, Stevie FA, Griffis DP Applied Surface Science, 254(9), 2708, 2008 |
| 2 |
Utilization of electron impact ionization of gaseous and sputtered species in the secondary ion acceleration region of a magnetic sector SIMS instrument Pivovarov A, Gu C, Stevie F, Griffis D Applied Surface Science, 231-2, 781, 2004 |
| 3 |
Improved charge neutralization method for depth profiling of bulk insulators using O-2(+) primary beam on a magnetic sector SIMS instrument Pivovarov AL, Stevie FA, Griffis DP Applied Surface Science, 231-2, 786, 2004 |
| 4 |
Selenium Concentrations in Natural and Environmental Waters Conde JE, Alaejos MS Chemical Reviews, 97(6), 1979, 1997 |