화학공학소재연구정보센터
검색결과 : 2건
No. Article
1 Ultrathin SiO2 layers formation by ultraslow single- and multicharged ions
Borsoni G, Le Roux V, Laffitte R, Kerdiles S, Bechu N, Vallier L, Korwin-Pawlowski ML, Vannuffel C, Bertin F, Vergnaud C, Chabli A, Wyon C
Solid-State Electronics, 46(11), 1855, 2002
2 Pulsed Ion-Beam Surface-Analysis as a Means of in-Situ Real-Time Analysis of Thin-Films During Growth
Krauss AR, Lin Y, Auciello O, Lamich GJ, Gruen DM, Schultz JA, Chang RP
Journal of Vacuum Science & Technology A, 12(4), 1943, 1994