검색결과 : 1건
| No. | Article |
|---|---|
| 1 |
Characterisation of metal oxide semiconductor capacitor structure using low-k dielectric methylsilsesquioxane with evaporated aluminium and copper gate Aw KC, Ibrahim K Thin Solid Films, 434(1-2), 178, 2003 |
| No. | Article |
|---|---|
| 1 |
Characterisation of metal oxide semiconductor capacitor structure using low-k dielectric methylsilsesquioxane with evaporated aluminium and copper gate Aw KC, Ibrahim K Thin Solid Films, 434(1-2), 178, 2003 |