검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
A propagation concept of negative bias temperature instability along the channel length in p-type metal oxide field effect transistor Djezzar B, Tahi H, Benabdelmoumene A, Chenouf A Solid-State Electronics, 82, 46, 2013 |
| 2 |
A novel experimental technique: combined gated-diode method for extracting lateral distribution of interface traps in SOI NMOSFETs He J, Zhang X, Huang A, Huang R Solid-State Electronics, 45(7), 1107, 2001 |