검색결과 : 7건
| No. | Article |
|---|---|
| 1 |
Front and back side SIMS analysis of boron-doped delta-layer in diamond Pinault-Thaury MA, Jomard F, Mer-Calfati C, Tranchant N, Pomorski M, Bergonzo P, Arnault JC Applied Surface Science, 410, 464, 2017 |
| 2 |
Experimental study and modeling of laser plasma ion implantation for WSex/Fe-57 interface modification Fominski VY, Grigoriev SN, Gnedovets AG, Romanov RI, Volosova MA Applied Surface Science, 276, 242, 2013 |
| 3 |
Growth of amorphous SiC film on Si by means of ion beam induced mixing Barna A, Gurban S, Kotis L, Labar J, Sulyok A, Toth AL, Menyhard M, Kovac J, Panjan P Applied Surface Science, 263, 367, 2012 |
| 4 |
Secondary ion mass spectrometry with gas cluster ion beams Toyoda N, Matsuo J, Aoki T, Yamada I, Fenner DB Applied Surface Science, 203, 214, 2003 |
| 5 |
Approaching the limit for quantitative SIMS measurement of ultra-thin nitrided SiO2 films Novak SW, Bekos EJ, Marino JW Applied Surface Science, 175, 678, 2001 |
| 6 |
Dynamic nitrogen and titanium plasma ion implantation/deposition at different bias voltages Tian XB, Wang LP, Zhan QY, Chu PK Thin Solid Films, 390(1-2), 139, 2001 |
| 7 |
Thin film analysis via accelerator-based nuclear methods Lieb KP Thin Solid Films, 380(1-2), 269, 2000 |