| 1 |
Influence of ion beam parameters onto two-dimensional optical thin film thickness distributions deposited by ion beam sputtering
Sakiew W, Schrameyer S, Jupe M, Schwerdtner P, Erhart N, Starke K, Ristau D
Thin Solid Films, 682, 109, 2019 |
| 2 |
Synthesis and characterisation of high-entropy alloy thin films as candidates for coating nuclear fuel cladding alloys
Tunes MA, Vishnyakov VM, Donnelly SE
Thin Solid Films, 649, 115, 2018 |
| 3 |
Systematic investigation of the properties of TiO2 films grown by reactive ion beam sputter deposition
Bundesmann C, Lautenschlager T, Spemann D, Finzel A, Thelander E, Mensing M, Frost F
Applied Surface Science, 421, 331, 2017 |
| 4 |
X-ray photoelectron spectroscopy studies on AlN thin films grown by ion beam sputtering in reactive assistance of N+/N-2(+) ions: Substrate temperature induced compositional variations
Sharma N, Ilango S, Dash S, Tyagi AK
Thin Solid Films, 636, 626, 2017 |
| 5 |
Application of dynamic scaling theory for growth kinetic studies of AlN-thin films deposited by ion beam sputtering in reactive assistance of nitrogen plasma
Sharma N, Prabakar K, Ilango S, Dash S, Tyagi AK
Applied Surface Science, 347, 875, 2015 |
| 6 |
Ion beam sputter deposition of Ag films: Influence of process parameters on electrical and optical properties, and average grain sizes
Bundesmann C, Feder R, Gerlach JW, Neumann H
Thin Solid Films, 551, 46, 2014 |
| 7 |
Growth kinetics of ion beam sputtered Al-thin films by dynamic scaling theory
Sharma N, Prabakar K, Dash S, Tyagi AK
Thin Solid Films, 573, 84, 2014 |
| 8 |
Ion beam sputter deposition of V2O5 thin films
Gallasch T, Stockhoff T, Baither D, Schmitz G
Journal of Power Sources, 196(1), 428, 2011 |
| 9 |
Ion beam sputter deposited TiAlN films for metal-insulator-metal (Ba,Sr)TiO3 capacitor application
Lee SY, Wang SC, Chen JS, Huang JL
Thin Solid Films, 516(21), 7816, 2008 |
| 10 |
Advanced ion beam technology for versatile oxide thin film formation
Han YG, Lee JH, Yeo UJ, Song SK, Sung JW, Cho JS, Koh SK, Kim H
Current Applied Physics, 7(5), 561, 2007 |
