화학공학소재연구정보센터
검색결과 : 6건
No. Article
1 The alleviation of radiation-damage on Nb/MgO film driven by strain gradient in He ion irradiation
Du JL, Qiu YH, Zhang J, Huang JC, Wu ZM, Zhang XF, Wang YH, Baldwin JK, Wang YQ, Wang YG, Fu EG
Applied Surface Science, 465, 1014, 2019
2 Determination of three-dimensional interfacial strain - A novel method of probing interface structure with X-ray Bragg-surface diffraction
Sun WC, Chu CH, Chang HC, Wu BK, Chen YR, Cheng CW, Chiu MS, Shen YC, Wu HH, Hung YS, Chang SL, Hong MH, Tang MT, Stetsko Y
Thin Solid Films, 515(14), 5716, 2007
3 Interface strain profiling in ultrathin SiO2 gate oxides with medium energy ion scattering spectroscopy
Moon DW, Lee HI
Current Applied Physics, 3(1), 45, 2003
4 Structural and optical properties of InGaN/GaN multiple quantum wells: The effect of the number of InGaN/GaN pairs
Kim DJ, Moon YT, Song KM, Choi CJ, Ok YW, Seong TY, Park SJ
Journal of Crystal Growth, 221, 368, 2000
5 Strain near SiO2-Si interface revealed by X-ray diffraction intensity enhancement
Emoto T, Akimoto K, Ishikawa Y, Ichimiya A, Tanikawa A
Thin Solid Films, 369(1-2), 281, 2000
6 Dislocation half loop formation in GaSb/(001)GaAs islands and steps role: a Monte Carlo simulation
Dalla Torre J, Rouhani MD, Landa G, Rocher AM, Malek R, Esteve D
Thin Solid Films, 336(1-2), 277, 1998