1 |
Lateral Crystallization Velocity in Explosive Crystallization of Amorphous Silicon Films Induced by Flash Lamp Annealing Ohdaira K, Tomura N, Ishii S, Matsumura H Electrochemical and Solid State Letters, 14(9), H372, 2011 |
2 |
Spectroscopic ellipsometry on sinusoidal surface-relief gratings Antos R, Ohlidal I, Franta D, Klapetek P, Mistrik J, Yamaguchi T, Visnovsky S Applied Surface Science, 244(1-4), 221, 2005 |
3 |
Wave packet interferometry without phase-locking Leichtle C, Schleich WP, Averbukh IS, Shapiro M Journal of Chemical Physics, 108(15), 6057, 1998 |
4 |
An investigation of the effects of two level system coupling on single molecule lineshapes in low temperature glasses Brown FLH, Silbey RJ Journal of Chemical Physics, 108(17), 7434, 1998 |
5 |
Raman scattering from a Brownian oscillator with nonohmic Drude dissipation : Applications to continuous wave, impulsive, and noisy excitation Ulness DJ, Kirkwood JC, Albrecht AC Journal of Chemical Physics, 109(11), 4478, 1998 |
6 |
Interferometric Down-Conversion of High-Frequency Molecular Vibrations with Time-Frequency-Resolved Coherent Raman-Scattering Using Quasi-CW Noisy Light - C-H Stretching Modes of Chloroform and Benzene Ulness DJ, Stimson MJ, Kirkwood JC, Albrecht AC Journal of Physical Chemistry A, 101(25), 4587, 1997 |
7 |
Femtosecond Dephasing in Porous Silicon Moniatte J, Honerlage B, Levy R, Tomasiunas R, Pelant I Thin Solid Films, 297(1-2), 135, 1997 |