검색결과 : 3건
| No. | Article |
|---|---|
| 1 |
Low frequency noise and hot-carrier reliability in advanced SOI MOSFETs Dieudonne F, Haendler S, Jomaah J, Balestra F Solid-State Electronics, 48(6), 985, 2004 |
| 2 |
Improvement of hot-carrier-reliability by deuterium termination of Si/SiO2 interface defects Takahashi H, Yamada-Kaneta H Applied Surface Science, 216(1-4), 347, 2003 |
| 3 |
Hot-carrier degradation in deep-submicrometer nMOSFETs: lightly doped drain vs. large angle tilt implanted drain Rafi JM, Campabadal F Solid-State Electronics, 45(8), 1391, 2001 |