검색결과 : 1건
No. | Article |
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1 |
Depth profiles of boron and nitrogen in SiON films by backside SIMS Sameshima J, Maeda R, Yamada K, Karen A, Yamada S Applied Surface Science, 231-2, 614, 2004 |
No. | Article |
---|---|
1 |
Depth profiles of boron and nitrogen in SiON films by backside SIMS Sameshima J, Maeda R, Yamada K, Karen A, Yamada S Applied Surface Science, 231-2, 614, 2004 |