검색결과 : 5건
| No. | Article |
|---|---|
| 1 |
Investigation on small growth pits in 4H silicon carbide epilayers Ma XY, Chang HR, Zhang QC, Sudarshan T Journal of Crystal Growth, 279(3-4), 425, 2005 |
| 2 |
Correlation of EBIC and SWBXT imaged defects and epilayer growth pits in 6H-SiC Schottky diodes Schnabel CM, Tabib-Azar M, Neudeck PG, Bailey SG, Su HB, Dudley M, Raffaelle RP Materials Science Forum, 338-3, 489, 2000 |
| 3 |
Electrical impact of SiC structural crystal defects on high electric field devices Neudeck PG Materials Science Forum, 338-3, 1161, 2000 |
| 4 |
The effect of electrolyte properties on the mechanism of crevice corrosion in pure iron Cho KH, Abdulsalam MI, Pickering HW Journal of the Electrochemical Society, 145(6), 1862, 1998 |
| 5 |
Elucidation of a trigger mechanism for pitting corrosion of stainless steels using submicron resolution scanning electrochemical and photoelectrochemical microscopy Williams DE, Mohiuddin TF, Zhu YY Journal of the Electrochemical Society, 145(8), 2664, 1998 |