검색결과 : 2건
| No. | Article |
|---|---|
| 1 |
Data retention under gate stress on a NVM array Djenadi R, Micolau G, Postel-Pellerin J, Chiquet P, Laffont R, Ogier JL, Regnier A, Lalande F, Melkonian J Solid-State Electronics, 78, 80, 2012 |
| 2 |
Reliability implications in advanced embedded two-transistor-Fowler-Nordheim-NOR flash memory devices Scarpa A, Tao G, Dijkstra J, Kuper FG Solid-State Electronics, 46(11), 1765, 2002 |